1. Beam injection assessment of defects in semiconductors
Author: / edited by M. Kittler...(et al)
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Semiconductors- Defects- Congresses,Semiconductors- Defects- Testing
Classification :
QC10
.
J1I421
1998
2. 2000 IEEE International Workshop on Defect Based Testing, April 30, 2000, Montreal, Canada
Author: sponsored by IEEE Computer Society Test Technology Technical Committee; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Testing -- Congresses ، Metal oxide semiconductors, Complementary,Congresses ، Iddq testing,Defects -- Congresses ، Integrated circuits
Classification :
TK
7871
.
99
.
M44
2000
